Data caching for ferroelectric memory

ABSTRACT

Methods, systems, and devices for operating a memory device are described. One method includes caching data of a memory cell at a sense amplifier of a row buffer upon performing a first read of the memory cell; determining to perform at least a second read of the memory cell after performing the first read of the memory cell; and reading the data of the memory cell from the sense amplifier for at least the second read of the memory cell.

CROSS REFERENCE

The present application for patent is a continuation of U.S. patentapplication Ser. No. 16/122,526 by Kajigaya, entitled “Data Caching forFerroelectric Memory,” filed Sep. 5, 2018, which is a continuation ofU.S. patent application Ser. No. 15/140,073 by Kajigaya, entitled “DataCaching for Ferroelectric Memory,” filed Apr. 27, 2016, assigned to theassignee hereof, and each of which is expressly incorporated byreference in its entirety herein.

BACKGROUND

The following relates generally to memory devices, and more specificallyto data caching.

Memory devices are widely used to store information in variouselectronic devices such as computers, wireless communication devices,cameras, digital displays, and the like. Information is stored byprograming different states of a memory device. For example, binarydevices have two states, often denoted by a logic “1” or a logic “0.” Inother systems, more than two states may be stored. To access the storedinformation, the electronic device may read, or sense, the stored statein the memory device. To store information, the electronic device maywrite, or program, the state in the memory device.

Various types of memory devices exist, including random access memory(RAM), read only memory (ROM), dynamic RAM (DRAM), synchronous dynamicRAM (SDRAM), FeRAM, phase-change RAM (PCRAM), spin-transfer torque RAM(STT-RAM), resistive RAM (ReRAM), magnetic RAM (MRAM), flash memory, andothers. Memory devices may be volatile or non-volatile. Non-volatilememory, e.g., flash memory, can store data for extended periods of timeeven in the absence of an external power source. Volatile memorydevices, e.g., DRAM, may lose their stored state over time unless theyare periodically refreshed by an external power source. A binary memorydevice may, for example, include a charged or discharged capacitor. Acharged capacitor may become discharged over time through leakagecurrents, resulting in the loss of the stored information. Certainembodiments of volatile memory may offer performance advantages, such asfaster read or write speeds, while aspects of non-volatile memory, suchas the ability to store data without periodic refreshing, may beadvantageous.

In some cases, a FeRAM may be operated at a speed and with a nonvolatileproperty similar to that of a DRAM. In these cases, however, theferroelectric capacitors used in the memory cells of the FeRAM maysuffer from fatigue as a result of repeated polarizations and inversionsof the ferroelectric materials within the ferroelectric capacitors,resulting in a reduction of residual polarization. Also, when writingoperations are continuously carried out in the same polarizationdirection, a shift in the hysteresis characteristic of a memory cell,referred to as an “in-print,” may cause subsequent degradation in therewriting characteristic of the memory cell. Compared to a DRAM, a FeRAMmay therefore support fewer read-out and writing operations over itslifetime.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments of the disclosure are described with reference to thefollowing figures:

FIG. 1 illustrates an example memory device, in accordance with variousembodiments of the present disclosure;

FIG. 2 illustrates an example architecture of memory blocks and memoryareas of a memory device, such as the memory device, in accordance withvarious embodiments of the present disclosure;

FIG. 3 illustrates an example architecture of a memory area of a memoryblock, such as the memory area of the memory block, in accordance withvarious embodiments of the present disclosure;

FIG. 4 illustrates an example architecture of a memory area of a memoryblock, such as the memory area of the memory block, in accordance withvarious embodiments of the present disclosure;

FIG. 5 illustrates an apparatus including a plurality of memory banks,such as a plurality of memory banks of the memory device, the memoryblocks, or the memory areas described with reference to FIGS. 1-4 , inaccordance with various embodiments of the present disclosure;

FIG. 6 illustrates an example ferroelectric memory cell, in accordancewith various embodiments of the present disclosure;

FIG. 7 illustrates an example circuit diagram of a sense amplifier and abit line pre-charge circuit, in accordance with various embodiments ofthe present disclosure;

FIG. 8 illustrates an example circuit diagram of a sense latch (e.g.,sense circuit) substrate control circuit, in accordance with variousembodiments of the present disclosure;

FIG. 9 illustrates example waveforms that may be applied to variousterminals, or which may appear on various nodes, upon issuing a loadcommand and loading a logic one or high-level logic value from a memorycell to a sense amplifier, in accordance with various embodiments of thepresent disclosure;

FIG. 10 illustrates example waveforms that may be applied to variousterminals, or which may appear on various nodes, upon issuing a loadcommand and loading a logic zero or low-level logic value from a memorycell to a sense amplifier, in accordance with various embodiments of thepresent disclosure;

FIG. 11 illustrates example waveforms that may be applied to variousterminals, or which may appear on various nodes, upon issuing a storecommand and storing a logic one or high-level logic value stored at asense amplifier to a memory cell, in accordance with various embodimentsof the present disclosure;

FIG. 12 illustrates example waveforms that may be applied to variousterminals, or which may appear on various nodes, upon issuing a storecommand and storing a logic zero or low-level logic value stored at asense amplifier to a memory cell, in accordance with various embodimentsof the present disclosure;

FIG. 13 illustrates an example sequence of operations in which a dataword is loaded from a plurality of memory cells to a row buffer, andthen read from the row buffer instead of the memory cells, in accordancewith various embodiments of the present disclosure;

FIG. 14 illustrates an example sequence of operations in which a dataword is loaded from a plurality of memory cells to a row buffer, orwritten to the row buffer, and then read from the row buffer instead ofthe memory cells, in accordance with various embodiments of the presentdisclosure;

FIG. 15 shows a diagram of a system including a main memory subsystem,in accordance with various embodiments of the present disclosure;

FIG. 16 illustrates example waveforms that may be applied to variousterminals, or which may appear on various nodes, upon issuing a loadcommand and loading a logic one or high-level logic value from a memorycell to a sense amplifier, in accordance with various embodiments of thepresent disclosure;

FIG. 17 illustrates an example sequence of operations in which a dataword is loaded from a first plurality of memory cells to a row buffer,and then stored in a second plurality of memory cells, in accordancewith various embodiments of the present disclosure;

FIG. 18 shows a flowchart illustrating a method of operating a memorydevice or system, in accordance with various embodiments of the presentdisclosure; and

FIG. 19 shows a flowchart illustrating a method of operating a memorydevice or system, in accordance with various embodiments of the presentdisclosure.

DETAILED DESCRIPTION

The disclosed techniques relate to a memory device having a plurality ofmemory cells (e.g., ferroelectric memory cells, such as Fe-RAM or hybridRAM (HRAM) cells). Ferroelectric memory cells have an informationstorage capacitor having a ferroelectric film. Over time, theferroelectric film may deteriorate and performance of the ferroelectricmemory cell may degrade. In one embodiment of the techniques describedherein, data of a memory cell may be cached at a sense amplifier of arow buffer upon performing a first read of the memory cell. Upondetermining to perform at least a second read of the memory cell, afterthe first read of the memory cell, the data of the memory cell may beread from the sense amplifier instead of the memory cell. In thismanner, fewer direct reads of the memory cell may be performed, and thelifetime of the memory cell may be extended. Power consumption may alsobe reduced by caching data in sense amplifiers. By caching data formultiple banks of a memory device in respective row buffers, the memorydevice can be operated as a sort of multi-page cache. When storing newdata to a memory cell, the new data may be written to a sense amplifier,and then to a memory cell. Subsequently, the new data may be read fromthe sense amplifier without having to load the new data from the memorycell to the sense amplifier (i.e., because the new data is alreadycached in the sense amplifier). Again, the number of direct reads of thememory cell is reduced, the lifetime of the memory cell may be extended,and power consumption may be reduced. Command bus efficiency may also beimproved, because a load command does not need to be issued beforereading the new data from the memory cell.

In another embodiment of the techniques described herein, processes of amulticore processor may be mapped to different groups of memory banks ina memory device, in which each memory bank is associated with a rowbuffer. A plurality of memory cells associated with a memory address ina memory bank may then be addressed, to retrieve a data word. Theplurality of memory cells may be addressed upon receiving a first memoryread request associated with the memory address from a process of theplurality of processes. Upon receiving, from the process, a secondmemory read request associated with the memory address, the row bufferassociated with the memory bank may be addressed to retrieve the dataword. The mapping of processes to different groups of memory banks maytend to increase the hit rate within the row buffers of the memorydevice, which may reduce the number of direct reads of memory cells,increase the lifetimes of the memory cells, and reduce power consumptionby a memory device.

Embodiments of the disclosure introduced above are further describedbelow in the context of a memory device. Specific examples of a hybridmemory are then described. These and other embodiments of the disclosureare further illustrated by and described with reference to apparatusdiagrams, system diagrams, and flowcharts that relate to theconfiguration, operation, and use of a hybrid memory.

FIG. 1 illustrates an example memory device 100, in accordance withvarious embodiments of the present disclosure. The memory device 100 mayinclude a plurality of memory cells arranged in a plurality of memoryblocks (e.g., eight memory blocks including a first memory block 105-a,a second memory block 105-b, and an eighth memory block 105-h). Thememory cells may be addressed by an address including a column address,a row address, and a bank address. The column address may be received bya column address buffer 110 and applied to a column decoder 115 and aparallel/serial conversion circuit 145. The row address may be receivedby a row address buffer 120 and applied to a bank control circuit 135,which bank control circuit 135 may, in turn, provide the row address toa row decoder 125. The bank address may be received by a bank addressbuffer 130 and applied to a bank control circuit 135.

Data read from a subset of the memory cells may be amplified at aread/write (RW) amplifier 140, converted to a serial data stream by theparallel/serial conversion circuit 145, and temporarily stored in a datainput/output buffer 150. Data written to a subset of the memory cellsmay be temporarily stored in the data input/output buffer 150, convertedto a parallel data stream by the parallel/serial conversion circuit 145,and amplified at the RW amplifier 140 before being written to the subsetof the memory cells.

A read command or write command may be received and decoded by a commanddecoder 155. Decoded commands may be provided from the command decoder155 to a chip control circuit 160, and a mode signal may be providedfrom a mode circuit 165 to the chip control circuit 160. The chipcontrol circuit 160 may provide signals to control the column addressbuffer 110, the row address buffer 120, the bank address buffer 130, thebank control circuit 135, the RW amplifier 140, and the parallel/serialconversion circuit 145. A clock generation circuit 170 may provide oneor more clock signals to the parallel/serial conversion circuit 145, thedata input/output buffer 150, the command decoder 155, and the chipcontrol circuit 160.

A memory controller may control the operation of memory cells in thememory device 100 through the various components of the memory device100. For example, a memory controller may generate column, row, and bankaddress signals in order to activate desired word lines and digit linesof the memory blocks 105, to access memory cells of the memory blocks105. The memory controller may also generate and control various voltagepotentials used during the operation of the memory device 100. Ingeneral, the amplitude, shape, or duration of an applied voltagediscussed herein may be adjusted or varied and may be different for thevarious operations discussed in operating the memory device 100.

FIG. 2 illustrates an example architecture 200 of memory blocks 105 andmemory areas 205 of a memory device, such as the memory device 100, inaccordance with various embodiments of the present disclosure. Eachblock 105 and each memory area 205 may include a plurality of memorycells. In some examples, the blocks 105 may include eight blocks (e.g.,a first memory block 105-a, a second memory block 105-b, a third memoryblock 105-c, a fourth memory block 105-d, a fifth memory block 105-e, asixth memory block 105-f, a seventh memory block 105-g, and an eighthmemory block 105-h).

Each of the memory blocks 105 shown in FIG. 2 may be subdivided into aplurality of memory areas 205. For example, the first memory block 105-amay be subdivided into a first memory area 205-a, a second memory area205-b, a third memory area 205-c, and a fourth memory area 205-d. Insome examples, each memory block 105 may cover a rectangular area of amemory chip, with column decoders 115-a implemented along a firstdimension of each memory block 105 (e.g., a horizontal dimension), androw decoders 125-a implemented along a second dimension of each memoryblock (e.g., along a vertical dimension).

FIG. 3 illustrates an example architecture 300 of a memory area of amemory block, such as the memory area 205-a of the memory block 105-a,in accordance with various embodiments of the present disclosure. Thememory area 205-a may include a plurality of memory banks 305 (e.g.,sixteen memory banks, including a first memory bank 305-a, a secondmemory bank 305-b, a third memory bank 305-c, a fourteenth memory bank305-n, a fifteenth memory bank 305-o, and a sixteenth memory bank305-p).

As shown in FIG. 3 , memory cells within the memory banks 305 may beaddressed by a column decoder 310, a plurality of per-memory bank rowdecoders 315 (e.g., a first row decoder 315-a, a second row decoder315-b, a third row decoder 315-c, a fourteenth row decoder 315-n, afifteenth row decoder 315-o, and a sixteenth row decoder 315-p), and aplurality of per-memory bank bank control circuits 320 (e.g., a firstbank control circuit 320-a, a second bank control circuit 320-b, a thirdbank control circuit 320-c, a fourteenth bank control circuit 320-n, afifteenth bank control circuit 320-o, and a sixteenth bank controlcircuit 320-p). In some examples, a column address may be provided tothe column decoder, and a bank address, row address, and load command orstore command may be provided to each bank control circuit 320. Eachbank control circuit 320 may latch the row address in an associatedaddress latch 325 (e.g., a first address latch 325-a, a second addresslatch 325-b, a third address latch 325-c, a fourteenth address latch325-n, a fifteenth address latch 325-o, or a sixteenth address latch325-p)) and pass the row address to a corresponding row decoder 315.

Upon addressing a memory bank 305 during a load command, a plurality ofsense amplifiers in a row buffer 330 associated with the memory bank 305(e.g., a plurality of sense amplifiers in the row buffer 330-a/330-bassociated with the first memory bank 305-a) may receive data from aplurality of memory cells, amplify the data, and latch the data forread-out on the IO lines 335. Upon addressing a memory bank 305 during astore command, data on the IO lines 335 may be amplified by the senseamplifiers in a row buffer 330 and stored in a plurality of memorycells.

Each bank control circuit 320 may provide a number of control signals tothe sense amplifiers of a row buffer 330. In some examples, the controlsignals may include a bank select (BS) signal, a plate voltage (PL), anisolation gate control signal (TG), a bit line pre-charge signal (PCB),a sense amplifier pre-charge signal (PCS), a reference voltageapplication signal (REF), or a sense circuit activation signal (CS).Example uses of these signals when loading or storing data within amemory bank is described with reference to FIGS. 9-14, 16, and 17 .

FIG. 4 illustrates an example architecture 400 of a memory area of amemory block, such as the memory area 205-a of the memory block 105-a,in accordance with various embodiments of the present disclosure. Thememory area 205-a may include a plurality of memory sub-banks 405 (e.g.,sixteen memory sub-banks, including a first memory sub-bank 405-a, asecond memory sub-bank 405-b, a third memory sub-bank 405-c, afourteenth memory sub-bank 405-n, a fifteenth memory sub-bank 405-o, anda sixteenth memory sub-bank 405-p).

As shown in FIG. 4 , memory cells within the memory sub-banks 405 may beaddressed by a column decoder 410, a plurality of per-memory bank rowdecoders 415 (e.g., a first row decoder 415-a, a second row decoder415-b, a third row decoder 415-c, a fourteenth row decoder 415-n, afifteenth row decoder 415-o, and a sixteenth row decoder 415-p), and abank control circuit 420. In some examples, a column address may beprovided to the column decoder 410, and a bank address, row address, andload command or store command may be provided to the bank controlcircuit 420. The bank control circuit 420 may latch the row address inone of a per memory sub-bank address latch 425 (e.g., a first addresslatch 425-a, a second address latch 425-b, a third address latch 425-c,a fourteenth address latch 425-n, a fifteenth address latch 425-o, or asixteenth address latch 425-p)) and pass the row address to acorresponding row decoder 415.

Upon addressing a memory sub-bank 405 during a load command, a pluralityof sense amplifiers in a row buffer 430 associated with the memorysub-bank 405 (e.g., a plurality of sense amplifiers in the row buffer430-a/430-b associated with the first memory sub-bank 405-a) may receivedata from a plurality of memory cells, amplify the data, and latch thedata for read-out on the IO lines 435. Upon addressing a memory sub-bank405 during a store command, data on the IO lines 435 may be amplified bythe sense amplifiers in a row buffer 430 and stored in a plurality ofmemory cells.

The bank control circuit 420 may provide a number of control signals tothe sense amplifiers of a row buffer 430. In some examples, the controlsignals may include a bank select (BS) signal, a plate voltage (PL), anisolation gate control signal (TG), a bit line pre-charge signal (PCB),a sense amplifier pre-charge signal (PCS), a reference voltageapplication signal (REF), or a sense circuit activation signal (CS).Example uses of these signals when loading or storing data within amemory bank is described with reference to FIGS. 9-14, 16, and 17 , andmay be applied in a similar manner to loading or storing data within amemory sub-bank.

The per-memory bank bank control circuits 320 described with referenceto FIG. 3 may be used to provide independent interleaved access tomemory banks 305, but may take more chip area than the shared bankcontrol circuit 420 described with reference to FIG. 4 . However, byproviding a sub-bank address to the shared bank control circuit 420,along with a bank address, reading and writing of all row buffersassociated with all memory sub-banks is possible. Loading and storingprocesses for some memory sub-banks 405 and reading and writingprocesses for other memory sub-banks 405 may be interleaved. However, inthe case of loading and/or storing processes for some memory sub-banks405 in the same area 400, memory sub-bank interleaving may not beavailable.

FIG. 5 illustrates an apparatus 500 including a plurality of memorybanks 305, such as a plurality of memory banks of the memory device 100,the memory blocks 105, or the memory areas 205 described with referenceto FIGS. 1-4 , in accordance with various embodiments of the presentdisclosure. In some examples, the apparatus 500 may include a firstmemory bank 305-a, a second memory bank 305-b, and a third memory bank305-c. The apparatus 500 may alternatively include more or fewer memorybanks 305.

Each of the memory banks 305 may include a plurality of memory cells 505that are programmable to store different states. For example, eachmemory cell 505 may be programmable to store two states, denoted a logic0 and a logic 1. In some cases, a memory cell 505 may be configured tostore more than two logic states. A memory cell 505 may include acapacitor to store a charge representative of the programmable states;for example, a charged and uncharged capacitor may represent two logicstates. DRAM architectures may commonly use such a design, and thecapacitor employed may include a dielectric material with linearelectric polarization properties. By contrast, a ferroelectric memorycell may include a capacitor that has a ferroelectric as the dielectricmaterial. Ferroelectric materials have non-linear polarizationproperties.

Operations such as reading and writing may be performed on the memorycells 505 by activating or selecting an appropriate word line (WL) andbit line (BL). In some cases, a bit line may be referred to as a digitline. Activating or selecting a word line or bit line may includeapplying a voltage potential to the respective line. Word lines and bitlines may be made of conductive materials. In some examples, the wordlines and bit lines may be made of metals (e.g., copper, aluminum, gold,tungsten, etc.). Each row of memory cells 505 may be connected to asingle word line (e.g., to WLm1, WLm2, WLmj-1, or WLmj, where m is amemory bank indicator and j is a number of word lines addressing amemory bank 305), and each column of memory cells 505 may be connectedto a single bit line (e.g., to BLm1, BLm2, BLm3, BLm4, BLmk-1, or BLmk,where k is a number of bit lines addressing a memory bank). Theintersection of a word line and a bit line may be referred to as anaddress of a memory cell. By activating one word line and all of the bitlines associated with a memory bank 305, a data word may be read into arow buffer including a plurality of sense amplifiers 510 (including,e.g., the sense amplifiers SAm1 510-a, SAm2 510-b, SAm3 510-c, SAm4510-d, SAmk-1 510-e, and SAmk 510-f).

In some architectures, the logic storing device of a memory cell 505,e.g., a capacitor, may be electrically isolated from a bit line by aselection device. The word line may be connected to and may control theselection device. For example, the selection device may be a transistorand the word line may be connected to the gate of the transistor.Activating the word line may result in an electrical connection betweenthe capacitor of the memory cell 505 and its corresponding bot line.Upon activating the word line associated with a memory cell 505 mayenable the bit line associated with the memory cell 505 to be accessedfor the purpose of reading or writing the memory cell 505.

Upon accessing a memory cell 505 during a read operation, a logic valuestored in the memory cell 505 may be sensed by the sense amplifier 510associated with the memory cell's bit line. For example, the senseamplifier 510 may compare a logic value (e.g., a voltage) of therelevant bit line to a reference signal (e.g., a reference voltage, notshown) in order to determine the stored state or logic value of thememory cell 505. For example, when the bit line has a higher voltagethan the reference voltage, the sense amplifier 510 may determine thatthe stored state in the memory cell 505 is a logic one or high-levellogic value, and when the bit line has a lower voltage than thereference voltage, the sense amplifier 510 may determine that the storedstate in the memory cell 505 is a logic zero or low-level logic value. Asense amplifier 510 may include various transistors or amplifiers inorder to detect and amplify a difference in voltages, which may bereferred to as latching. The detected logic state of a memory cell 505may then be output on an IO line.

A memory cell 505 may be set, or written, by similarly activating arelevant word line and digit line for the memory cell 505. As discussedabove, activating a word line electrically connects a corresponding rowof memory cells 505 to their respective bit lines. By controlling arelevant bit line for a memory cell 505 while the word line associatedwith the memory cell 505 is activated, the memory cell 505 may bewritten—i.e., a logic value may be stored in the memory cell 505. In thecase of a memory cell having a ferroelectric capacitor, the memory cell505 may be written by applying a voltage across the ferroelectriccapacitor.

In some memory architectures, accessing a memory cell 505 may degrade ordestroy the stored logic state, and re-write or refresh operations maybe performed to return the original logic state to the memory cell 505.In a DRAM, for example, the capacitor may be partially or completelydischarged during a sense operation, corrupting the stored logic state.A stored logic state may therefore be re-written after a senseoperation. Additionally, activating a single word line may result in thedischarge of all memory cells in the row; and thus, all memory cells 505in the row may need to be re-written.

Some memory architectures, including DRAM architectures, may lose theirstored state over time unless they are periodically refreshed by anexternal power source. For example, a charged capacitor may becomedischarged over time through leakage currents, resulting in the loss ofthe stored information. The refresh rate of these so-called volatilememory devices may be relatively high, e.g., tens of refresh operationsper second for DRAM, which may result in significant power consumption.With increasingly larger memory arrays, increased power consumption mayinhibit the deployment or operation of memory arrays (e.g., powersupplies, heat generation, material limits, etc.), especially for mobiledevices that rely on a finite power source, such as a battery.

Each bit line of the second memory bank 305-b may be selectively coupledto an input terminal of a respective sense amplifier in a row buffer.For example, each of a plurality of isolation gates 515 (e.g., nMOStransistors) may have source and drain terminals coupled, respectively,to a bit line (e.g., BLm1, BLm2, BLm3, BLm4, BLmk-1, or BLmk) of thesecond memory bank 305-b and a corresponding one of the sense amplifiers(e.g., the sense amplifier SAm1 510-a, SAm2 510-b, SAm3 510-c, SAm4510-d, SAmk-1 510-e, or SAmk 510-f). A region control signal (TGm)applied to the gate terminals of the isolation gates 515 may operate theisolation gates 515 to open the isolation gates 515 and decouple the bitlines of the second memory bank 305-b from the sense amplifiers 510, orclose the isolation gates 515 and couple the bit lines of the secondmemory bank 305-b to the sense amplifiers 510. When the isolation gates515 are closed, a data word may be read from or written to a row ofmemory cells 505 associated with an activated word line.

Each of the bit lines may be associated with a bit line pre-chargecircuit 520. During a read of a row of memory cells 505, the bit linepre-charge circuits 520 may pre-charge the bit lines to a low levelwhile the isolation gates 515 are open. A word line may then beactivated, and the isolation gates 515 may be closed to couple the bitlines to the sense amplifiers 510 and read a data word stored in thememory cells 505 associated with the activated word line onto the bitlines. The sense amplifiers 510 may then compare the voltages of the bitlines to a reference voltage to determine the stored states of thememory cells 505. The stored states of the memory cells 505 may bestored (e.g., latched) at the sense amplifiers 510. When a next accessof the second memory bank 305-b is associated with the same word line asan immediate prior access, the data stored in the memory cells may beread from the sense amplifiers 510 instead of the memory cells 505.Accessing the data stored in the sense amplifiers 510 can save one ormore additional accesses of the memory cells. When data stored in asubset of memory cells 505 is read from the sense amplifiers 510 insteadof the memory cells 505, the memory cells 505 need not be coupled to thesense amplifiers 510 and the isolation gates 515 may remain open. Also,the bit lines may be pre-charged to the same voltage level as the platevoltage (PLm) of the memory cells 505. When both the plate voltages andthe bit lines are held at the same voltage (e.g., a low voltage level,such as VSS), the leakage currents associated with the memory cells 505are minimized, and the longevity of the memory cells 505 may beextended.

FIG. 6 illustrates an example ferroelectric memory cell 600, inaccordance with various embodiments of the present disclosure. Theferroelectric memory cell 600 may include a selection device and a logicstorage component. The selection device may include a transistor havinga source terminal 605, a drain terminal 610, and a gate terminal 645.The logic storage component may include a capacitor 620 that includestwo conductive electrodes, a cell plate electrode (PLT), and a storagenode electrode (SN). The electrodes of the capacitor 620 may beseparated by an insulating ferroelectric material. As described above,various states may be stored by charging or discharging the capacitor620.

In some examples, the source and drain terminals 605, 610 may be n-typeimpurity layers (or wells) formed in a p-type silicon substrate 625. Thesource and drain terminals 605, 610 may be insulated from other activeregions by element separation insulating films 630 and 635. A gatedielectric film 640 may be formed on a portion of the source terminal605, the substrate 625, and the drain terminal 610. A gate terminal 645may be formed on the gate dielectric film 640.

The source terminal 605 may be coupled to the storage node electrode(SN) of the capacitor 620 by a first metal line and/or conductive via(e.g., at a storage node (VSN)). The cell plate electrode (PLT) of thecapacitor 620 may be coupled to a cell plate node (PL) by a second metalline and/or conductive via. The drain terminal 610 may be coupled to abit line (BL) 650 by a third metal line and/or conductive via. The gateterminal 645 may be coupled to a word line (WL) 655 by a fourth metalline and/or conductive via.

In operation, a high voltage level (e.g., VPP) may be applied to theword line (WL) 655 to activate the selection device and induce a currentflow between the storage node (VSN) and the bit line (BL) 650.Conversely, a low voltage level (e.g., VKK) may be applied to the wordline (WL) 655 to de-activate the selection device and retard currentflow between the storage node (VSN) and the bit line (BL) 650. When theword line (WL) 655 is at the low voltage level, the voltages of the cellplate node (PL), the bit line (BL) 650, and the substrate 625 (e.g., thePsub voltage) may be held at a low voltage level (e.g., VSS) to reduceleakage currents in the selection device. This state, in which the wordline (WL) 655 is held at the low voltage level, and the voltages of thecell plate node (PL), the bit line (BL) 650, and the substrate 625 areheld at a low voltage level (e.g., VSS), may be maintained as the datastored in the memory cell 600 is read from a sense amplifier coupled tothe bit line (BL) 650 instead of the memory cell 600. In other words,the voltage level of the word line (WL) 655 may be held at the lowvoltage level (e.g., VKK), and the voltage on the bit line (BL) 650 maybe allowed to fluctuate as a result of current flow through theselection device, when data stored in the memory cell 600 is beingloaded into a sense amplifier, or when new data is being written intothe memory 600.

FIG. 7 illustrates an example circuit diagram 700 of a sense amplifier705 and a bit line pre-charge circuit 710, in accordance with variousembodiments of the present disclosure. In some examples, the senseamplifier 705 may be an example embodiment of one of the senseamplifiers 510 described with reference to FIG. 5 . In some examples,the sense amplifier 705 may include a sense circuit that compares thevoltages on nodes BLSm and /BLSm, where /BLSm is a complimentary (ordifferential) node with respect to BLSm, and where the notation “m” inBLSm and other signals indicates that the signals are generated for amemory bank “m”. The sense circuit may latch the sense voltages. By wayof example, the sense circuit may include a set of four transistors,including two pMOS transistors 715-a, 715-b and two nMOS transistors720-a, 720-b. The sense amplifier 705 may also include a first pair oftransistors (e.g., nMOS transistors 725-a and 730-a) and a second pairof transistors (e.g., nMOS transistors 725-b and 730-b) for respectivelycoupling the BLSm and /BLSm nodes to the nodes IO and/IO of an I/Oregister. The source and drain terminals of each pair of transistors maybe coupled in series between one of the nodes BLSm or /BLSm and one ofthe I/O register nodes IO or/IO. The gate terminal of one transistor ineach pair (e.g., the gate terminals of transistors 725-a and 725-b) maybe driven by a bank select signal BSm, and the gate terminal of theother transistor in each pair (e.g., the gate terminals of transistors730-a and 730-b) may be driven by a column selection signal YS.

The sense amplifier 705 may include a sense amplifier pre-charge circuitoperable to bias the nodes BLSm and /BLSm to a first voltage (e.g., VSS)prior to loading (in the sense amplifier 705) data stored in a memorycell connected to the bit line BLm. The sense amplifier pre-chargecircuit may include a pair of transistors 735-a, 735-b coupled by sourceand drain terminals between a low voltage potential (e.g., VSS orground) and the node BLSm or /BLSm, and having gate terminals driven bya sense amplifier pre-charge (PCSm) signal. A third transistor 740,coupled by source and drain terminals between the nodes BLSm and /BLSm,may also have a gate terminal driven by the PCSm signal.

The sense amplifier 705 may also include a bias circuit operable to biasthe node /BLSm to a reference voltage (Vref). The node /BLSm may bebiased to the reference voltage after pre-charging the nodes BLSm and/BLSm to the low voltage potential, and prior to loading (in the senseamplifier 705) data stored in a memory cell connected to the bit lineBLm. The bias circuit may include a transistor 745 coupled by source anddrain terminals between the node /BLSm and a node maintained at thereference voltage (Vref) potential. The gate terminal of the transistor745 may be driven by a REFm signal.

The bit line pre-charge circuit 710 may include a transistor 750 coupledby source and drain terminals between the bit line BLm and a low voltagepotential (e.g., VSS or ground). The gate terminal of the transistor 750may be driven by a bit line pre-charge (PCBm) signal. The PCBm signalmay be asserted to pull the bit line BLm to a low level (e.g., VSS) whennot loading data from a memory cell to the sense amplifier 705 via thebit line BLm.

The bit line BLm may be coupled to the sense amplifier 705 by anisolation gate 515-a. The isolation gate 515-a may include a transistorcoupled by source and drain terminals between the bit line BLm and thenode BLSm. The gate terminal of the transistor may be driven by a regioncontrol signal TGm, as described with reference to FIG. 5 .

FIG. 8 illustrates an example circuit diagram of a sense latch (e.g.,sense circuit) substrate control circuit 800, in accordance with variousembodiments of the present disclosure. The sense latch substrate controlcircuit 800 may be used to provide a first set of substrate voltages(e.g., VDD and VSS) or a second set of substrate voltages (e.g., VDL andVSH) to a sense circuit such as the sense circuit described withreference to FIG. 7 . The first set of substrate voltages may include afirst pMOS substrate voltage, VDD, and a first nMOS substrate voltage,VSS. The second set of substrate voltages may include a second pMOSsubstrate voltage, VDL, and a second nMOS substrate voltage, VSH. Thefirst pMOS substrate voltage (VDD) may be higher than the second pMOSsubstrate voltage (VDL), and the first nMOS substrate voltage (VSS) maybe lower than the second nMOS substrate voltage (VSH). A voltageselection circuit 835 may configure the sense latch substrate controlcircuit 800 to output a pMOS substrate voltage (at node NWm) and a nMOSsubstrate voltage (at node PWm). The voltages at nodes NWm and PWm maybe used to configure a sense circuit of a sense amplifier (e.g., thesense circuit of the sense amplifier 705 described with reference toFIG. 7 ) using the first set of substrate voltages or the second set ofsubstrate voltages. The first set of substrate voltages may provide ahigher threshold voltage for the sense circuit at other times, therebyreducing the leakage current of a row buffer including the senseamplifier. The second set of substrate voltages may provide a lowerthreshold voltage (Vt) for the sense circuit when loading data stored ina memory cell into the sense amplifier, when storing data stored in thesense amplifier in a memory cell, when reading data from the senseamplifier, or when writing data to the sense amplifier.

In some examples, the sense latch substrate control circuit 800 mayinclude a first pMOS transistor 805, a second pMOS transistor 810, afirst nMOS transistor 815, and a second nMOS transistor 820. The firstpMOS transistor 805 may be coupled by source and drain terminals betweena node NWm and a node maintained at the first pMOS substrate voltage,VDD. In some examples, the node NWm may provide a pMOS substrate voltageto the sense circuit of the sense amplifier 705 described with referenceto FIG. 7 . The second pMOS transistor 810 may be coupled by source anddrain terminals between the node NWm and the second pMOS substratevoltage, VDL. The first nMOS transistor 815 may be coupled by source anddrain terminals between a node PWm and a node maintained at the firstnMOS substrate voltage, VSS. In some examples, the node PWm may providea nMOS substrate voltage to the sense circuit of the sense amplifier 705described with reference to FIG. 7 . The second nMOS transistor 820 maybe coupled by source and drain terminals between the node PWm and thesecond nMOS substrate voltage, VSH.

The voltage selection circuit 835 may include a NOR gate 830 having, asinputs, a sense amplifier enable (SEm) signal and a bank selection (BSm)signal. The output of the NOR gate 830 may provide a non-inverted output840 of the voltage selection circuit 835. The non-inverted output 840 ofthe voltage selection circuit 835 may be received by an inverter 845.The output of the inverter 845 may provide an inverted output 850 of thevoltage selection circuit 835. The gate terminals of the second pMOStransistor 810 and the first nMOS transistor 815 may be coupled to thenon-inverted output 840, and the gate terminals of the first pMOStransistor 805 and second nMOS transistor 820 may be coupled to theinverted output 850.

In operation, assertion of the SEm signal (during a load or storeoperation) or the BSm signal (during a read or write operation) causesthe non-inverted output 840 of the voltage selection circuit 835 to bepulled to a low level, causing the inverted output 850 of the voltageselection circuit 835 to be pulled to a high level, causing the secondpMOS transistor 810 to conduct and pull the node NWm to VDL, and causingthe second nMOS transistor 820 to conduct and pull the node PWm to VSH.Absent the SEm signal and BSm signal being asserted, the non-invertedoutput 840 of the voltage selection circuit 835 is pulled to a highlevel, causing the inverted output 850 of the voltage selection circuit835 to be pulled to a low level, causing the first pMOS transistor 805to conduct and pull the node NWm to VDD, and causing the first nMOStransistor 815 to conduct and pull the node PWm to VSS.

FIG. 9 illustrates example waveforms 900 that may be applied to variousterminals, or which may appear on various nodes, upon issuing a loadcommand and loading a logic one or high-level logic value from a memorycell to a sense amplifier, in accordance with various embodiments of thepresent disclosure. By way of example, the sense amplifier is assumed tostore a low-level logic value prior to the load of the high-level logicvalue. By way of further example, the memory cell may be one of thememory cell 505 or 600 described with reference to FIG. 5 or 6 , and thesense amplifier may be one of the sense amplifiers described withreference to FIG. 5 .

During a sense amplifier pre-charge period 905, the PCS signal may beswitched from a low level (VSS) to a high level (VDD), and the CS signalmay be switched from a high level (VDD) to a low level (VSS). Switchingthe PCS signal to the high level enables a sense amplifier pre-chargecircuit including a pair of pull-down transistors that pull the /BLSnode to the low level (VSS) and hold the BLS node at the low level(VSS). Also during the sense amplifier pre-charge period, a previouslyasserted word line (WL′) may be switched from a high level (VPP) to alow level (VKK). After switching the previously asserted word line, thePCS signal may be switched from a high level (VDD) to a low level (VSS),thereby disabling the sense amplifier pre-charge circuit, and the PCBsignal may be switched from a high level (VDD) to a low level (VSS),thereby disabling the bit line pre-charge circuit.

During a cell selection and read-out period 910 following the senseamplifier pre-charge period 905, the TG signal may be switched from alow level (VSS) to a high level (VPP) to close the isolation gate andcouple a bit line (BL) to the BLS node. Substantially in parallel withclosing the isolation gate, the REF signal may be switched from a lowlevel (VSS) to a high level (VDD) to drive the gate of a transistor thatapplies a reference voltage (Vref) to the /BLS node. A word line (WL)may then be asserted (transitioned from a low level (VKK) to a highlevel (VPP)) to select a set of memory cells storing a data word andread a stored logic value onto the bit line (BL) and the BLS node. Byway of example, FIG. 9 shows the logic value to be a logic one orhigh-level logic value. Substantially in parallel with asserting theword line (WL), the cell plate voltage (PL) of the set of memory cellsmay be switched from a low level (VSS) to a high level (VDD), and theREF signal may be switched from the high level (VDD) to the low level(VSS). Raising the cell plate voltage may cause the stored logic valueto be read from the memory cells. After reading the stored logic valueonto the bit line and BLS node, the TG signal may be switched from thehigh level (VPP) to the low level (VSS) to open the isolation gate andde-couple the bit line (BL) from the BLS node.

During a sense amplification period 915 following the cell selection andread-out period 910, the CS signal may be switched from the low level(VSS) to the high level (VDD), causing the sense amplifier to amplify adifference between the logic value read onto the BLS node and thereference signal (Vref) applied to the /BLS node. The amplificationdrives the BLS node to a high level (VDD) and drives the /BLS node to alow level (VSS). Following amplification of the logic value read ontothe BLS node, the TG signal may be switched from a low level (VSS) to ahigh level (VPP), again closing the isolation gate in a re-writingperiod 920 following the sense amplification period 915.

During the re-writing period 920, the amplified logic level on the BLSnode (i.e., a logic one) is transferred back to the bit line (BL). Thecell plate voltage (PL) may then be switched from the high level (VDD)to the low level (VSS) to re-write the logic one or high-level logicvalue to the memory cell.

During a bit line pre-charge period 925 following the re-writing period920, the TG signal may be switched form the high level (VPP) to the lowlevel (VSS), again opening the isolation gate. Also, the PCB signal maybe switched from a low level (VSS) to a high level (VDD), causing thebit line (BL) to transition from the high level (VDD) to the low level(VSS). After the bit line is pre-charged, both the plate voltage and thebit line voltage may be held at the same voltage (e.g., a low voltagelevel, such as VSS), thereby mitigating leakage currents associated withthe memory cell and extending the longevity of the memory cell.

The waveforms 900 assume the memory cell is configured to operate in adestructive reading mode. If the memory cell is not configured tooperate in a destructive reading mode, data need not be transferred backto the memory cell during the re-writing period 920.

FIG. 10 illustrates example waveforms 1000 that may be applied tovarious terminals, or which may appear on various nodes, upon issuing aload command and loading a logic zero or low-level logic value from amemory cell to a sense amplifier, in accordance with various embodimentsof the present disclosure. By way of example, the sense amplifier isassumed to store a high-level logic value prior to the load of thelow-level logic value. By way of further example, the memory cell may beone of the memory cell 505 or 600 described with reference to FIG. 5 or6 , and the sense amplifier may be one of the sense amplifiers describedwith reference to FIG. 5 .

During a sense amplifier pre-charge period 1005, the PCS signal may beswitched from a low level (VSS) to a high level (VDD), and the CS signalmay be switched from a high level (VDD) to a low level (VSS). Switchingthe PCS signal to the high level enables a sense amplifier pre-chargecircuit including a pair of pull-down transistors that pull the /BLSnode to the low level (VSS) and hold the BLS node at the low level(VSS). Also during the sense amplifier pre-charge period, a previouslyasserted word line (WL′) may be switched from a high level (VPP) to alow level (VKK). After switching the previously asserted word line, thePCS signal may be switched from a high level (VDD) to a low level (VSS),thereby disabling the sense amplifier pre-charge circuit, and the PCBsignal may be switched from a high level (VDD) to a low level (VSS),thereby disabling the bit line pre-charge circuit.

During a cell selection and read-out period 1010 following the senseamplifier pre-charge period 1005, the TG signal may be switched from alow level (VSS) to a high level (VPP) to close the isolation gate andcouple a bit line (BL) to the BLS node. Substantially in parallel withclosing the isolation gate, the REF signal may be switched from a lowlevel (VSS) to a high level (VDD) to drive the gate of a transistor thatapplies a reference voltage (Vref) to the /BLS node. A word line (WL)may then be asserted (transitioned from a low level (VKK) to a highlevel (VPP)) to select a set of memory cells storing a data word andread a stored logic value onto the bit line (BL) and the BLS node. Byway of example, FIG. 10 shows the logic value to be a logic zero orlow-level logic value. Substantially in parallel with asserting the wordline (WL), the cell plate voltage (PL) of the set of memory cells may beswitched from a low level (VSS) to a high level (VDD), and the REFsignal may be switched from the high level (VDD) to the low level (VSS).Raising the cell plate voltage may cause the stored logic value to beread from the memory cells. After reading the stored logic value ontothe bit line and BLS node, the TG signal may be switched from the highlevel (VPP) to the low level (VSS) to open the isolation gate andde-couple the bit line (BL) from the BLS node.

During a sense amplification period 1015 following the cell selectionand read-out period 1010, the CS signal may be switched from the lowlevel (VSS) to the high level (VDD), causing the sense amplifier toamplify a difference between the logic value read onto the BLS node andthe reference signal (Vref) applied to the /BLS node. The amplificationdrives the BLS node to a low level (VSS) and drives the /BLS node to ahigh level (VDD). Following amplification of the logic value read ontothe BLS node, the TG signal may be switched from a low level (VSS) to ahigh level (VPP), again closing the isolation gate in a re-writingperiod 1020 following the sense amplification period 1015.

During the re-writing period 1020, the amplified logic level on the BLSnode (i.e., a logic zero) is transferred back to the bit line (BL) andthe logic zero or low-level logic value is re-written to the memorycell. The cell plate voltage (PL) may then be switched from the highlevel (VDD) to the low level (VSS).

During a bit line pre-charge period 1025 following the re-writing period1020, the TG signal may be switched form the high level (VPP) to the lowlevel (VSS), again opening the isolation gate. Also, the PCB signal maybe switched from a low level (VSS) to a high level (VDD), therebyre-enabling the bit line pre-charge circuit. After the bit line ispre-charged, both the plate voltage and the bit line voltage may be heldat the same voltage (e.g., a low voltage level, such as VSS), therebymitigating leakage currents associated with the memory cell andextending the longevity of the memory cell.

The waveforms 1000 assume the memory cell is configured to operate in adestructive reading mode. If the memory cell is not configured tooperate in a destructive reading mode, data need not be transferred backto the memory cell during the re-writing period 1020.

FIG. 11 illustrates example waveforms 1100 that may be applied tovarious terminals, or which may appear on various nodes, upon issuing astore command and storing a logic one or high-level logic value storedat a sense amplifier to a memory cell, in accordance with variousembodiments of the present disclosure. By way of example, the memorycell may be one of the memory cell 505 or 600 described with referenceto FIG. 5 or 6 , and the sense amplifier may be one of the senseamplifiers described with reference to FIG. 5 .

Prior to a data transfer period 1105, the BLS node of a sense amplifiermay be pulled to a high level (VDD) representing the logic one to bestored, and the /BLS node of the sense amplifier may be pulled to a lowlevel (VSS). Also prior to the data transfer period, a bit line (BL)coupled to a memory cell in which a logic one is to be stored may beheld at a low level (VSS).

During a data transfer period 1105, the PCB signal may be switched froma high level (VDD) to a low level (VSS), thereby disabling a bit linepre-charge circuit. Also, the TG signal may be switched from a low level(VSS) to a high level (VPP) to close the isolation gate and couple a bitline (BL) to the BLS node. Closing the isolation gate causes the highlevel of the BLS node (i.e., the logic high to be stored) to betransferred to the bit line (BL).

During a writing period 1110, the cell plate voltage (PL) of the memorycell may be temporarily switched from a low level (VSS) to a high level(VDD), and then returned to the low level to re-write the logic one orhigh-level logic value to the memory cell.

During a bit line pre-charge period 1115 following the writing period,the TG signal may be switched form the high level (VPP) to the low level(VSS), again opening the isolation gate. Also, the PCB signal may beswitched from a low level (VSS) to a high level (VDD), therebyre-enabling the bit line pre-charge circuit and causing the bit line(BL) to transition from the high level (VDD) to the low level (VSS).After the bit line is pre-charged, both the plate voltage and the bitline voltage may be held at the same voltage (e.g., a low voltage level,such as VSS), thereby mitigating leakage currents associated with thememory cell and extending the longevity of the memory cell.

FIG. 12 illustrates example waveforms 1200 that may be applied tovarious terminals, or which may appear on various nodes, upon issuing astore command and storing a logic zero or low-level logic value storedat a sense amplifier to a memory cell, in accordance with variousembodiments of the present disclosure. By way of example, the memorycell may be one of the memory cell 505 or 600 described with referenceto FIG. 5 or 6 , and the sense amplifier may be one of the senseamplifiers described with reference to FIG. 5 .

Prior to a data transfer period 1205, the BLS node of a sense amplifiermay be pulled to a low level (VSS) representing the logic zero to bestored, and the /BLS node of the sense amplifier may be pulled to a highlevel (VDD). Also prior to the data transfer period, a bit line (BL)coupled to a memory cell in which the logic zero is to be stored may beheld at a low level (VSS).

During a data transfer period 1205, the PCB signal may be switched froma high level (VDD) to a low level (VSS), thereby disabling a bit linepre-charge circuit. Also, the TG signal may be switched from a low level(VSS) to a high level (VPP) to close the isolation gate and couple a bitline (BL) to the BLS node. Closing the isolation gate causes the lowlevel of the BLS node (i.e., the logic zero to be stored) to betransferred to the bit line (BL).

During a writing period 1210, the cell plate voltage (PL) of the memorycell may be temporarily switched from a low level (VSS) to a high level(VDD), at which the logic zero or low-level logic value may bere-written to the memory cell, and then the cell plate voltage may bereturned to the low level.

During a bit line pre-charge period 1215 following the writing period,the TG signal may be switched form the high level (VPP) to the low level(VSS), again opening the isolation gate. Also, the PCB signal may beswitched from a low level (VSS) to a high level (VDD), therebyre-enabling the bit line pre-charge circuit. After the bit line ispre-charged, both the plate voltage and the bit line voltage may be heldat the same voltage (e.g., a low voltage level, such as VSS), therebymitigating leakage currents associated with the memory cell andextending the longevity of the memory cell.

In some cases, wear leveling may be performed in conjunction with a loadcommand, as described with reference to FIG. 16 or 17 .

FIG. 13 illustrates an example sequence of operations 1300 in which adata word is loaded from a plurality of memory cells to a row buffer,and then read from the row buffer instead of the memory cells, inaccordance with various embodiments of the present disclosure. By way ofexample, the memory cell may be one of the memory cell 505 or 600described with reference to FIG. 5 or 6 , and the sense amplifier may beone of the sense amplifiers described with reference to FIG. 5 .

At time t1, a load command (LD) may be issued to load a first data word(stored in the plurality of memory cells) into the row buffer. The loadcommand may be associated with a bank address (BAm) and a first rowaddress (RAa) of the first data word. In some examples, the load commandmay executed as described with reference to FIG. 9 or 10 . After thefirst data word is loaded into the row buffer, a number of read commandsmay be issued to read the first data word from the row buffer. Forexample, a read command (RD) associated with the bank address (BAm) anda column address (CA) may be issued at time t2, following time t1. Anynumber of additional read commands may be issued following time t1. Uponissuing a read command that returns a “miss”, a load command may beissued at time t3 to load a second data word into the row buffer. Thesecond data word may be associated with the bank address (BAm) and asecond row address (RAb). The second data word may be read from the rowbuffer any number of times following the time t3. During a read of therow buffer, the memory cells that store a corresponding data word arenot disturbed. For memory cells that can only be read a limited numberof times, the caching of data words in the row buffer can extend thelife of a memory including the memory cells.

As also shown in FIG. 13 , a plurality of sense enable (SEm) signals maybe asserted upon issuance of a load command. As described with referenceto FIG. 8 , assertion of a SEm signal may lower the threshold voltage(Vt) of a sense circuit of a sense amplifier when loading a data wordinto a row buffer including the sense amplifier. Similarly, a bankselect (BSm) signal may be asserted upon issuance of a read command. Asdescribed with reference to FIG. 8 , assertion of a BSm signal may lowerthe threshold voltage (Vt) of a sense circuit of a sense amplifier whenreading a data word from a row buffer including the sense amplifier.

As also shown in FIG. 13 , a column selection signal (YS) may beasserted in combination with assertion of the BSm signal. Assertion ofboth the BSm and YS signals upon issuance of a read command may enable adata word to be read from a row buffer (i.e., a plurality of senseamplifiers), as described with reference to FIG. 7 .

FIG. 14 illustrates an example sequence of operations 1400 in which adata word is loaded from a plurality of memory cells to a row buffer, orwritten to the row buffer, and then read from the row buffer instead ofthe memory cells, in accordance with various embodiments of the presentdisclosure. By way of example, the memory cell may be one of the memorycell 505 or 605 described with reference to FIG. 5 or 6 , and the senseamplifier may be one of the sense amplifiers described with reference toFIG. 5 .

At time t1, a load command (LD) may be issued to load a first data word(stored in the plurality of memory cells) into the row buffer. The loadcommand may be associated with a bank address (BAm) and assertion of aword line corresponding to a first row address (RAa). In some examples,the load command may executed as described with reference to FIG. 9 or10 . After the first data word is loaded into the row buffer, a numberof read commands (not shown) may be issued to read the first data wordfrom the row buffer.

At a time t2, a write command (WR) may be issued to write a second dataword into the row buffer (e.g., from a memory controller). The writecommand may be associated with the bank address (BAm) and a columnaddress (CA) of the row buffer). After the second data word is writteninto the row buffer, a number of read commands (not shown) may be issuedto read the second data word from the row buffer. At a time t3, a storecommand (ST) may be issued to store the second data word in a pluralityof memory cells. The store command may be associated with the bankaddress (BAm), but the row address (e.g., the row address RAa) is notneeded because the corresponding word line is still asserted in thisexample. Following the store of the second data word in the plurality ofmemory cells, and in some examples, a read command (RD) associated withthe bank address (BAm) and the column address (CA) of the row buffer maybe issued (e.g., at a time t4 following the time t3). Any number ofadditional read commands may be issued following the time t2 or the timet3.

Upon issuing a read command that returns a “miss”, a load command may beissued at time t5 to load a third data word into the row buffer. Thethird data word may be associated with the bank address (BAm) and asecond row address (RAb). The third data word may be read from the rowbuffer any number of times following the time t5. During a read of therow buffer, the memory cells that store a corresponding data word arenot disturbed. For memory cells that can only be read a limited numberof times, the caching of data words in the row buffer can extend thelife of a memory including the memory cells.

As also shown in FIG. 14 , a plurality of sense enable (SEm) signals maybe asserted upon issuance of a load command or a store command. Asdescribed with reference to FIG. 8 , assertion of a SEm signal may lowerthe threshold voltage (Vt) of a sense circuit of a sense amplifier whenloading a data word into a row buffer including the sense amplifier, orwhen storing a data word stored in the row buffer to a plurality ofmemory cells. Similarly, a bank select (BSm) signal may be asserted uponissuance of a read command or a write command. As described withreference to FIG. 8 , assertion of a BSm signal may lower the thresholdvoltage (Vt) of a sense circuit of a sense amplifier when reading a dataword from a row buffer including the sense amplifier, or when writing adata word received from a memory controller into the row buffer. Atother times, the threshold voltages of the sense circuits associatedwith the sense amplifiers of a row buffer may be raised, to reduce theleakage current of the row buffer.

As also shown in FIG. 14 , a column selection signal (YS) may beasserted in combination with assertion of the BSm signal. Assertion ofboth the BSm and YS signals upon issuance of a read command or a writecommand may enable a data word to be read from a row buffer (i.e., aplurality of sense amplifiers) or written to the row buffer, asdescribed with reference to FIG. 7 .

FIG. 15 shows a diagram of a system 1500 including a main memorysubsystem, in accordance with various embodiments of the presentdisclosure. The system 1500 may include a device 1505, which may be orinclude a printed circuit board to connect or physically support variouscomponents.

The device 1505 may include a main memory subsystem 1510, which may bean example of the memory device 100 described in FIG. 1 . The mainmemory subsystem 1510 may contain a memory controller 1565 and aplurality of memory banks 1570. In some examples, the memory banks 1570may be examples of the memory banks described with reference to FIG. 3or 5 , and each memory bank may be associated with a row buffer(including sense amplifiers) that is configured as described withreference to FIG. 3, 5 , or 7.

The device 1505 may also include a processor 1515, a direct memoryaccess controller (DMAC) 1520, a BIOS component 1525, peripheralcomponent(s) 1530, and an input/output controller 1535. The componentsof the device 1505 may be in electronic communication with one anotherthrough a bus 1540. The processor 1515 may be configured to operate themain memory subsystem 1510 through the memory controller 1565. In somecases, the memory controller 1565 may be integrated into the processor1515. The processor 1515 may be a general-purpose processor, a digitalsignal processor (DSP), an application-specific integrated circuit(ASIC), a field-programmable gate array (FPGA) or other programmablelogic device, discrete gate or transistor logic, discrete hardwarecomponents, or a combination of these types of components. In someexamples, the processor 1515 may be a multicore processor. The processor1515 may perform various functions described herein. The processor 1515may, for example, be configured to execute computer-readableinstructions stored in the memory banks 1570 to cause the device 1505 toperform various functions or tasks.

The DMAC 1520 may enable the processor 1515 to perform direct memoryaccesses within the main memory subsystem 1510.

The BIOS component 1525 may be a software component that includes abasic input/output system (BIOS) operated as firmware, which mayinitialize and run various hardware components of the system 1500. TheBIOS component 1525 may also manage data flow between the processor 1515and various other components, e.g., the peripheral component(s) 1530,the input/output controller 1535, etc. The BIOS component 1525 mayinclude a program or software stored in read-only memory (ROM), flashmemory, or any other non-volatile memory.

The peripheral component(s) 1530 may be any input or output device, oran interface for such devices, that is integrated into the device 1505.Examples of peripheral devices may include disk controllers, soundcontrollers, graphics controllers, Ethernet controllers, modems, USBcontrollers, serial or parallel ports, or peripheral card slots, such asperipheral component interconnect (PCI) or accelerated graphics port(AGP) slots.

The input/output controller 1535 may manage data communication betweenthe processor 1515 and the peripheral component(s) 1530, the inputdevice(s) 1545, the output device(s) 1550, and/or the sub-memory device1555 (e.g., a hard disk drive (HDD) and/or a solid state drive (SSD)).The input/output controller 1535 may also manage peripherals notintegrated into the device 1505. In some cases, the input/outputcontroller 1535 may represent a physical connection or port to anexternal peripheral.

The input device(s) 1545 may represent a device or signal external tothe device 1505 that provides input to the device 1505 or itscomponents. This may include a user interface or interface with orbetween other devices. In some cases, the input device(s) 1545 mayinclude a peripheral that interfaces with the device 1505 via theperipheral component(s) 1530, or that can be managed by the input/outputcontroller 1535.

The output device(s) 1550 may represent a device or signal external tothe device 1505 that is configured to receive output from the device1505 or any of its components. Examples of the output device(s) 1550 mayinclude a display, audio speakers, a printing device, another processoror printed circuit board, etc. In some cases, output device(s) 1550 mayinclude a peripheral that interfaces with the device 1505 via one of theperipheral component(s) 1530, or that can be managed by the input/outputcontroller 1535.

The components of the device 1505, including the memory controller 1565and the memory banks 1570, may include circuitry designed to carry outtheir functions. This may include various circuit elements, for example,conductive lines, transistors, capacitors, inductors, resistors,amplifiers, or other active or inactive elements, configured to carryout the functions described herein.

In some examples, an operating system (OS) executed by the processor1515 may map processes (or cores) of the multicore processor todifferent groups of memory banks in a memory device (e.g., in the mainmemory subsystem 1510). Each memory bank may be associated with a rowbuffer, as described, for example, with reference to FIG. 3, 5 , or 7.The mapping of processes (or cores) to groups of memory banks may beused to maintain spatial locality of data within row buffers, therebyincreasing the likelihood of a hit when a data word is retrieved from aplurality of memory cells. When the hit rate is improved, the number ofaccesses of the memory cells may be reduced, which in some cases mayshorten read latency and/or extend the life of the memory cells. In someexamples, a mapping of processes (or cores) to groups of memory banksmay be changed in accordance with changes in working set sizes of theprocesses (or cores). In some examples, continuous pages inside aworking set may be developed in row buffers of different memory bankswithin a group of memory banks.

In some examples, the processor 1515 may have 16 cores and the mainmemory subsystem 1510 may be partitioned into 512 memory banks. In theseexamples, the memory banks may be allocated to the cores equally (e.g.,each core may be mapped to a different group of 32 memory banks (e.g.,Core 1 may be mapped to memory banks 1 to 32; Core 2 may be mapped tomemory banks 33 to 64; . . . . Core 16 may be mapped to memory banks 481to 512)) or unequally (e.g., different cores may be mapped to differentnumbers of memory banks).

In some examples, the processor 1515 may issue at least one of a readcommand or a write command. Upon issuance of a read command, the memorycontroller 1565 may identify a memory address (e.g., a bank address anda row address) associated with the read command and attempt to read adata word from a row buffer associated with a memory bank. When there isa hit in the row buffer, the memory controller 1565 may provide the dataword stored in the row buffer to the processor 1515, as described, forexample, with reference to FIG. 9, 10 , or 13. When there is a miss inthe row buffer, the memory controller 1565 may cause the data word to beread from a plurality of memory cells in the memory bank and stored inthe row buffer as the data word is provided to the processor 1515, asdescribed, for example, with reference to FIG. 9 or 10 . Upon issuanceof a write command, the memory controller 1565 may identify a memoryaddress (e.g., a bank address and a row address) associated with thewrite command and write a data word to a row buffer associated with amemory bank, as described, for example, with reference to FIG. 11 or 12. The data word stored in the row buffer may then be stored in aplurality of memory cells of the memory bank, as described, for example,with reference to FIG. 11, 12 , or 14.

FIGS. 16 and 17 show how techniques described in the present disclosuremay be used to perform a wear leveling operation in which, for example,data read from a first plurality of memory cells associated with a firstrow address may be stored in a second plurality of memory cellsassociated with a second row address, without a need to read the datafrom a memory device (e.g., without a need for memory I/O activity). Insome examples, a wear leveling operation may be performed by countingthe number of loading and storing processes performed for each memorybank (or sub-bank) of a memory device, and upon performance of apredetermined number of loading and/or storing processes within a memorybank (or sub-bank), a wear leveling operation may be performed withinthe memory bank (or sub-bank). In some examples, the memory cells towhich a data word is stored during a wear leveling operation may beidentified as a plurality of memory cells associated with a data gap(e.g., no data word, or a data word that is no longer useful).

FIG. 16 illustrates example waveforms 1600 that may be applied tovarious terminals, or which may appear on various nodes, upon issuing aload command and loading a logic one or high-level logic value from amemory cell to a sense amplifier, in accordance with various embodimentsof the present disclosure. By way of example, the sense amplifier isassumed to store a low-level logic value prior to the load of thehigh-level logic value. By way of further example, the memory cell maybe one of the memory cell 505 or 600 described with reference to FIG. 5or 6 , and the sense amplifier may be one of the sense amplifiersdescribed with reference to FIG. 5 .

The waveforms 1600 are similar to the waveforms 900 described withreference to FIG. 9 , but for the word line (WL) and previously assertedword line (WL′) waveforms. More particularly, there is no previouslyasserted word line (WL′) waveform in the waveforms 1600, and the wordline (WL) waveform is transitioned to a low level (VKK) at the beginningof the bit line pre-charge period 925, just prior to (or substantiallyin parallel with) opening the isolation gate. In this manner, a memorybank (or sub-bank) may be prepared to receive a new row addressassociated with a different word line, following pre-charge of the bitline (BL) to the low level (VSS), so that the logic value stored in thesense amplifier during the cell selection may be stored to a memory cellthat differs from the memory cell from which the logic value was read(e.g., so that a wear leveling operation may be performed).

FIG. 17 illustrates an example sequence of operations 1700 in which adata word is loaded from a first plurality of memory cells to a rowbuffer, and then stored in a second plurality of memory cells, inaccordance with various embodiments of the present disclosure. By way ofexample, the memory cell may be one of the memory cell 505 or 600described with reference to FIG. 5 or 6 , and the sense amplifier may beone of the sense amplifiers described with reference to FIG. 5 .

At time t1, a load command (LD) may be issued to load a data word(stored in the first plurality of memory cells) into the row buffer. Theload command may be associated with assertion of a bank address (BAm)and a word line corresponding to a first row address (RAa). In someexamples, the load command may be executed as described with referenceto FIG. 9 or 10 . After the data word is loaded into the row buffer, afirst number of read commands (not shown) may or may not be issued toread the data word from the row buffer.

At a time t2, a store command (ST) may be issued to store the data word(which is stored in the row buffer) in the second plurality of memorycells. The store command may be associated with the bank address (BAm)and assertion of a word line corresponding to a second row address(RAb). After the data word is stored in the second plurality of memorycells, a second number of read commands (not shown) may or may not beissued to read the data word from the row buffer.

FIG. 18 shows a flowchart illustrating a method 1800 of operating amemory device or system, in accordance with various embodiments of thepresent disclosure. The operations of the method 1800 may be performedon or within a memory device or system, such as the memory device 100 orsystem 1500 described with reference to FIG. 1 or 15 , or on or within amemory device or system including the memory banks or memory cellsdescribed with reference to FIG. 3, 4, 5, 6, 15 , or 18. In someexamples, the operations of the method 1800 may be performed by or underthe control of a memory controller and/or memory device, such as thememory controller 1565 and/or memory device 100 described with referenceto FIG. 1 or 15 . In some examples, a memory controller and/or memorydevice may execute a set of codes to control the functional elements ofa memory bank to perform the functions described below. Additionally oralternatively, the memory controller and/or memory device may performaspects of the functions described below using special-purpose hardware.

At block 1805, the method may include caching data of a memory cell at asense amplifier of a row buffer upon performing a first read of thememory cell, as described, for example, with reference to FIG. 9 or 10 .In some examples, the memory cell may include a ferroelectric memorycell. In some examples, the ferroelectric memory cell may be configuredto operate in a destructive reading mode.

At block 1810, the method may include determining to perform at least asecond read of the memory cell after performing the first read of thememory cell, as described, for example, with reference to FIG. 13 . Thesecond read of the memory cell may include a next read of the memorycell following the first read of the memory cell.

At block 1815, the method may include reading the data of the memorycell from the sense amplifier for at least the second read of the memorycell, as described, for example, with reference to FIG. 13 .

At block 1820, and when the memory cell is configured to operate in adestructive reading mode, the method may optionally include writing thedata of the memory cell back to the memory cell after caching the dataof the memory cell at the sense amplifier, as described, for example,with reference to FIG. 9 or 10 .

At block 1825, the method may optionally include writing the data of thememory cell cached in the sense amplifier to another memory cell coupledto the sense amplifier (e.g., performing a wear leveling operation), asdescribed, for example, with reference to FIG. 16 or 17 .

In some examples, the method 1800 may include closing an isolation gate,prior to caching the data of the memory cell at the sense amplifier, tocouple a bit line to which the memory cell is coupled to the senseamplifier. The method may also include opening the isolation gate aftercaching the data of the memory cell at the sense amplifier, to decouplethe bit line from the sense amplifier. When the method includes there-writing operation(s) at block 1820, the method may include openingthe isolation gate after writing the data of the memory cell back to thememory cell. In some examples in which the re-writing operation(s) atblock 1820 are performed, the method may include opening the isolationgate while amplifying the data of the memory cell at the senseamplifier, closing the isolation gate prior to writing the data of thememory cell back to the memory cell, and re-opening the isolation gateafter writing the data of the memory cell back to the memory cell. Insome examples, the method may include pre-charging the bit line to asame voltage as a cell plate of the memory cell. When the method doesnot include the re-writing operation(s) at block 1820, the pre-chargingmay be performed after opening the isolation gate following caching ofthe data of the memory cell at the sense amplifier. When the method doesinclude the re-writing operation(s) at block 1820, the pre-charging maybe performed after opening the isolation gate following the re-writingoperation(s). In some examples, the data of the memory cell may be readfrom the sense amplifier, for at least the second read of the memorycell, while the isolation gate is open (i.e., while the bit line isdecoupled from the sense amplifier).

FIG. 19 shows a flowchart illustrating a method 1900 of operating amemory device or system, in accordance with various embodiments of thepresent disclosure. The operations of the method 1900 may be performedon or within a memory device or system, such as the memory device 100 orsystem 1500 described with reference to FIG. 1 or 15 , or on or within amemory device or system including the memory banks or memory cellsdescribed with reference to FIG. 3, 4, 5, 6, 15 , or 18. In someexamples, the operations of the method 1900 may be performed by or underthe control of a processor, memory controller, and/or memory device,such as the processor 1515, memory controller 1565, and/or memory device100 described with reference to FIG. 1 or 15 . In some examples, aprocessor, memory controller, and/or memory device may execute a set ofcodes to control the functional elements of a memory bank to perform thefunctions described below. Additionally or alternatively, the processor,memory controller, and/or memory device may perform aspects of thefunctions described below using special-purpose hardware.

At block 1905, the method may include mapping processes of a multicoreprocessor to different groups of memory banks in a memory device, asdescribed, for example, with reference to FIG. 15 . Each memory bank maybe associated with a row buffer. In some examples, the processes of themulticore processor may be mapped to the different groups of memorybanks based at least in part on mapping cores of the multicore processorto the different groups of memory banks.

At block 1910, the method may include addressing a plurality of memorycells associated with a memory address in a memory bank, to retrieve adata word, upon receiving a first memory read request associated withthe memory address from a process of the plurality of processes.

At block 1915, the method may include addressing a row buffer associatedwith the memory bank to retrieve the data word upon receiving, from theprocess, at least a second memory read request associated with thememory address. The second memory read request may include a next readrequest of the memory cell after the first memory read request.

It should be noted that methods 1800 and 1900 describes possibleimplementations, and the operations and steps of the methods 1800 and1900 may be rearranged or otherwise modified such that otherimplementations are possible. In some examples, aspects of the methods1800 and 1900 may be combined.

The description herein provides examples, and is not limiting of thescope, applicability, or examples set forth in the claims. Changes maybe made in the function and arrangement of elements discussed withoutdeparting from the scope of the disclosure. Various examples may omit,substitute, or add various procedures or components as appropriate.Also, features described with respect to some examples may be combinedin other examples.

The description set forth herein, in connection with the appendeddrawings, describes example configurations and does not represent allthe examples that may be implemented or that are within the scope of theclaims. The terms “example” and “exemplary,” as used herein, mean“serving as an example, instance, or illustration,” and not “preferred”or “advantageous over other examples.” The detailed description includesspecific details for the purpose of providing an understanding of thedescribed techniques. These techniques, however, may be practicedwithout these specific details. In some instances, well-known structuresand devices are shown in block diagram form in order to avoid obscuringthe concepts of the described examples.

In the appended figures, similar components or features may have thesame reference label. Further, various components of the same type maybe distinguished by following the reference label by a dash and a secondlabel that distinguishes among the similar components. When the firstreference label is used in the specification, the description isapplicable to any one of the similar components having the same firstreference label irrespective of the second reference label.

Information and signals described herein may be represented using any ofa variety of different technologies and techniques. For example, data,instructions, commands, information, signals, bits, symbols, and chipsthat may be referenced throughout the above description may berepresented by voltages, currents, electromagnetic waves, magneticfields or particles, optical fields or particles, or any combinationthereof. Some drawings may illustrate signals as a single signal;however, it will be understood by a person of ordinary skill in the artthat the signal may represent a bus of signals, where the bus may have avariety of bit widths.

As used herein, the term “virtual ground” refers to a node of anelectrical circuit that is held at a voltage of approximately zero volts(0V) but that is not directly connected with ground. Accordingly, thevoltage of a virtual ground may temporarily fluctuate and return toapproximately 0V at steady state. A virtual ground may be implementedusing various electronic circuit elements, such as a voltage dividerconsisting of operational amplifiers and resistors. Otherimplementations are also possible.

The term “electronic communication” refers to a relationship betweencomponents that supports electron flow between the components. This mayinclude a direct connection between components or may includeintermediate components. Components in electronic communication may beactively exchanging elections or signals (e.g., in an energized circuit)or may not be actively exchanging electrons or signals (e.g., in ade-energized circuit) but may be configured and operable to exchangeelectrons or signals upon a circuit being energized. By way of example,two components physically connected via a switch (e.g., a transistor)are in electronic communication regardless of the state of the switch(i.e., open or closed).

The devices discussed herein, including the memory device 100, may beformed on a semiconductor substrate, such as silicon, germanium,silicon-germanium alloy, gallium arsenide, gallium nitride, etc. In somecases, the substrate is a semiconductor wafer. In other cases, thesubstrate may be a silicon-on-insulator (SOI) substrate, such assilicon-on-glass (SOG) or silicon-on-sapphire (SOP), or epitaxial layersof semiconductor materials on another substrate. The conductivity of thesubstrate, or sub-regions of the substrate, may be controlled throughdoping using various chemical species including, but not limited to,phosphorous, boron, or arsenic. Doping may be performed during theinitial formation or growth of the substrate, by ion-implantation, or byany other doping means.

Transistors discussed herein may represent a field-effect transistor(FET) and comprise a three terminal device including a source, drain,and gate. The terminals may be connected to other electronic elementsthrough conductive materials, e.g., metals. The source and drain may beconductive and may comprise a heavily-doped, e.g., degenerate,semiconductor region. The source and drain may be separated by alightly-doped semiconductor region or channel. If the channel is n-type(i.e., majority carriers are electrons), then the FET may be referred toas a n-type FET. Likewise, if the channel is p-type (i.e., majoritycarriers are holes), then the FET may be referred to as a p-type FET.The channel may be capped by an insulating gate oxide. The channelconductivity may be controlled by applying a voltage to the gate. Forexample, applying a positive voltage or negative voltage to an n-typeFET or a p-type FET, respectively, may result in the channel becomingconductive. A transistor may be “on” or “activated” when a voltagegreater than or equal to the transistor's threshold voltage is appliedto the transistor gate. The transistor may be “off” or “deactivated”when a voltage less than the transistor's threshold voltage is appliedto the transistor gate.

The various illustrative blocks, components, and modules described inconnection with the disclosure herein may be implemented or performedwith a general-purpose processor, a DSP, an ASIC, an FPGA or otherprogrammable logic device, discrete gate or transistor logic, discretehardware components, or any combination thereof designed to perform thefunctions described herein. A general-purpose processor may be amicroprocessor, but in the alternative, the processor may be anyconventional processor, controller, microcontroller, or state machine. Aprocessor may also be implemented as a combination of computing devices(e.g., a combination of a DSP and a microprocessor, multiplemicroprocessors, one or more microprocessors in conjunction with a DSPcore, or any other such configuration).

The functions described herein may be implemented in hardware, softwareexecuted by a processor, firmware, or any combination thereof. Ifimplemented in software executed by a processor, the functions may bestored on or transmitted over as one or more instructions or code on acomputer-readable medium. Other examples and implementations are withinthe scope of the disclosure and appended claims. For example, due to thenature of software, functions described above can be implemented usingsoftware executed by a processor, hardware, firmware, hardwiring, orcombinations of any of these. Features implementing functions may alsobe physically located at various positions, including being distributedsuch that portions of functions are implemented at different physicallocations. Also, as used herein, including in the claims, “or” as usedin a list of items (for example, a list of items prefaced by a phrasesuch as “at least one of” or “one or more of”) indicates an inclusivelist such that, for example, a list of at least one of A, B, or C meansA or B or C or AB or AC or BC or ABC (i.e., A and B and C).

Computer-readable media includes both non-transitory computer storagemedia and communication media including any medium that facilitatestransfer of a computer program from one place to another. Anon-transitory storage medium may be any available medium that can beaccessed by a general purpose or special purpose computer. By way ofexample, and not limitation, non-transitory computer-readable media cancomprise RAM, ROM, electrically erasable programmable read only memory(EEPROM), compact disk (CD) ROM or other optical disk storage, magneticdisk storage or other magnetic storage devices, or any othernon-transitory medium that can be used to carry or store desired programcode means in the form of instructions or data structures and that canbe accessed by a general-purpose or special-purpose computer, or ageneral-purpose or special-purpose processor.

Also, any connection is properly termed a computer-readable medium. Forexample, if the software is transmitted from a website, server, or otherremote source using a coaxial cable, fiber optic cable, twisted pair,digital subscriber line (DSL), or wireless technologies such asinfrared, radio, and microwave, then the coaxial cable, fiber opticcable, twisted pair, digital subscriber line (DSL), or wirelesstechnologies such as infrared, radio, and microwave are included in thedefinition of medium. Disk and disc, as used herein, include CD, laserdisc, optical disc, digital versatile disc (DVD), floppy disk andBlu-ray disc where disks usually reproduce data magnetically, whilediscs reproduce data optically with lasers. Combinations of the aboveare also included within the scope of computer-readable media.

The description herein is provided to enable a person skilled in the artto make or use the disclosure. Various modifications to the disclosurewill be readily apparent to those skilled in the art, and the genericprinciples defined herein may be applied to other variations withoutdeparting from the scope of the disclosure. Thus, the disclosure is notto be limited to the examples and designs described herein but is to beaccorded the broadest scope consistent with the principles and novelfeatures disclosed herein.

What is claimed is:
 1. An apparatus, comprising: a bit line coupled with a memory cell; and a sense component coupled with the bit line, wherein the sense component comprises: a first transistor coupled with a first node configured to receive a first voltage at a first gate; a second transistor coupled with the first node configured to receive a second voltage at a second gate; a third transistor coupled with a second node configured to receive the first voltage at a third gate; a fourth transistor coupled with the second node configured to receive the second voltage at a fourth gate; and a pre-charge circuit coupled with the sense component, the pre-charge circuit configured to charge the first node and the second node to a third voltage before an access operation associated with the memory cell is initiated, wherein the pre-charge circuit comprises: a fifth transistor coupled with the first node and configured to bias the first node to the third voltage based at least in part on the first voltage and the second voltage being received; a sixth transistor coupled with the second node and configured to bias the second node to the third voltage based at least in part on the fifth transistor biasing the first node; and a seventh transistor coupled with the first node and a first input/output (I/O) line; and an eighth transistor coupled with the second node and a second I/O line.
 2. An apparatus comprising: a bit line coupled with a memory cell; and a sense component coupled with the bit line, wherein the sense component comprises: a first transistor coupled with a first node configured to receive a first voltage at a first gate; a second transistor coupled with the first node configured to receive a second voltage at a second gate; a third transistor coupled with a second node configured to receive the first voltage at a third gate; a fourth transistor coupled with the second node configured to receive the second voltage at a fourth gate; and a pre-charge circuit coupled with the sense component, the pre-charge circuit configured to charge the first node and the second node to a third voltage before an access operation associated with the memory cell is initiated, wherein the pre-charge circuit comprises: a fifth transistor coupled with the first node and configured to bias the first node to the third voltage based at least in part on the first voltage and the second voltage being received; a sixth transistor coupled with the second node and configured to bias the second node to the third voltage based at least in part on the fifth transistor biasing the first node; a seventh transistor configured to receive a fourth voltage at a fifth gate and output a fifth voltage to a third node, wherein the third node is configured to output the first voltage to the first gate and the third gate; and an eighth transistor configured to receive a sixth voltage at a sixth gate and output the third voltage to a fourth node, wherein the fourth node is configured to output the second voltage to the second gate and the fourth gate.
 3. The apparatus of claim 2, further comprising: a ninth transistor configured to receive the sixth voltage at a seventh gate and output a seventh voltage to the third node; and a tenth transistor configured to receive the fourth voltage at an eighth gate and output an eighth voltage to the fourth node.
 4. The apparatus of claim 3, further comprising: a logic circuit configured to: receive a signal indicating whether the access operation is being performed at the sense component; and generate the fourth voltage to activate the seventh transistor and the tenth transistor or generate the fifth voltage to activate the eighth transistor and the ninth transistor based at least in part on the signal.
 5. The apparatus of claim 1, further comprising a bit line pre-charge circuit configured to precharge the bit line, the bit line pre-charge circuit comprising: a ninth transistor coupled with the bit line and configured to output the third voltage to the bit line.
 6. A method, comprising: biasing, at a sense component of a memory device, a first gate of a first transistor to a first voltage, wherein the sense component comprises a first node and a second node; precharging, with a pre-charge circuit coupled with the sense component, the first node to a second voltage based at least in part on biasing the first gate of the first transistor to the first voltage, wherein the first node is coupled with a second transistor and a third transistor; biasing, at the sense component, a second gate of a fourth transistor to the first voltage based at least in part on biasing the first gate; precharging, with the pre-charge circuit, the second node to the second voltage based at least in part on biasing the second gate of the second transistor the second voltage, wherein the second node is coupled with a fifth transistor and a sixth transistors; biasing a third gate of the second transistor to a third voltage; and biasing a fourth gate of the third transistor to the second voltage.
 7. The method of claim 6, further comprising: activating a seventh transistor coupled with a third node to output the third voltage to the third gate; and activating an eighth transistor coupled with a fourth node to output the second voltage to the fourth gate.
 8. The method of claim 7, further comprising: receiving, at a logic coupled with a fifth gate of the seventh transistor and a sixth gate of the eighth transistor, an indication of whether an access operation is being performed at the sense component, the sense component comprising the first node and the second node; and generating a fourth voltage, based at least in part on receiving the indication, to activate the seventh transistor and the eighth transistor.
 9. The method of claim 7, further comprising: deactivating a ninth transistor coupled with the third node and a fourth voltage based at least in part on activating the seventh transistor; and deactivating a tenth transistor coupled with the fourth node and a fifth voltage based at least in part on activating the eighth transistor.
 10. The method of claim 9, further comprising: receiving, at a logic coupled with a fifth gate of the ninth transistor and a sixth gate of the tenth transistor, an indication of whether an access operation is being performed at the sense component, the sense component comprising the first node and the second node; and generating a sixth voltage, based at least in part on receiving the indication, to deactivate the ninth transistor and the tenth transistor.
 11. The method of claim 6, wherein biasing the second node further comprises: biasing a fifth gate of the fifth transistor to the third voltage; and biasing a sixth gate of the sixth transistor to the second voltage.
 12. An apparatus, comprising: a bit line coupled with a memory cell; a sense component coupled with the bit line, the sense component comprising a first node and a second node; and a controller coupled with the sense component and the bit line, the controller configured to cause the apparatus to: bias, at the sense component, a first gate of a first transistor to a first voltage; precharge the first node to a second voltage based at least in part on biasing the first gate of the first transistor to the first voltage, wherein the first node is coupled with a second transistor and a third transistor; bias, at the sense component, a second gate of a fourth transistor to the first voltage based at least in part on biasing the first gate; precharge the second node to the second voltage based at least in part on biasing the second gate of the second transistor the second voltage, wherein the second node is coupled with a fifth transistor and a sixth transistors; bias a third gate of the second transistor to a third voltage; and bias a fourth gate of the third transistor to the second voltage.
 13. The apparatus of claim 12, further comprising: a seventh transistor coupled with a third node, wherein the third node is coupled with the third gate; an eighth transistor coupled with a fourth node, wherein the fourth node is coupled with the fourth gate; and a logic coupled with a fifth gate of the seventh transistor and a sixth gate of the eighth transistor, the logic configured to: receive an indication of whether an access operation is being performed at the sense component; and output a fourth voltage based at least in part on receiving the indication.
 14. The apparatus of claim 13, wherein the logic is further configured to: activate the seventh transistor to output the third voltage to the third gate based at least in part on outputting the fourth voltage; and activate the eighth transistor to output the second voltage to the fourth gate based at least in part on outputting the fourth voltage.
 15. The apparatus of claim 13, further comprising: a ninth transistor coupled with the third node and a fifth voltage, wherein a seventh gate of the ninth transistor is coupled with the logic; and a tenth transistor coupled with the fourth node and a sixth voltage, wherein an eighth gate of the tenth transistor is coupled with the logic.
 16. The apparatus of claim 15, wherein the logic is further configured to: output a seventh voltage based at least in part on receiving the indication; deactivate the ninth transistor based at least in part on outputting the seventh voltage; and deactivate the tenth transistor based at least in part on outputting the seventh voltage.
 17. The apparatus of claim 12, wherein to precharge the second node, the controller is further configured to: bias a fifth gate of the fifth transistor to the third voltage; and bias a sixth gate of the sixth transistor to the second voltage. 